교수소개

김병호 부교수

Division of Electrical Engineering

연락처 : 031-400-5298

담당과목

전자회로, 확률 및 통계

관심연구분야

아날로그/혼성 신호 회로 및 시스템 디자인 및 테스트

학력

 2007년도 (미) Univ. of Texas at Austin 전자공학과 공학박사
 2000년도 한양대학교 전자공학과 공학석사
 1998년도 한양대학교 전자공학과 공학사

경력

 2015-현재: 한양대학교 조교수
 2010-2015: (미) 브로드컴 수석 연구원
 2007-2009: (미) 텍사스 인스트루먼트 (TI) 시니어 엔지니어
 2006-2006: (미) 네셔널 세미컨덕터 Research Intern
 2004-2006: (미) Univ. of Texas at Austin-Research Assistant
 IEEE Senior Member
 IEEE Transactions on Instrumentation and Measurement - reviewer service
 IEEE International Conference on Computer and Communication Technology - PC member

주요논문

 Byoungho Kim, et, al, A 10-bit 200-Msample/s Zero-Crossing Based Pipeline ADC in 0.13-um CMOS technology", IEEE Transactions on Very Large Scale Integration
 (VLSI) Systems (ISSN: 1063-8210), volume: 23, issue: 11, pages: 2671-2675, Nov. 2015.
 Byoungho Kim, et, al, Neuromorphic Hardware System for Visual Pattern Recognition with Memory Array and CMOS Neuron", IEEE Transactions on Industrial Electronics
 (TIE, ISSN: 0278-0046), volume: 62, issue: 4, pages: 2410-2419, Apr. 2015.
 Byoungho Kim and Jacob A. Abraham, Designing Nonlinearity Characterization for Mixed-Signal Circuits in System-On-Chip", Springer Analog Integrated Circuits and
 Signal Processing (ALOG, ISSN: 0925-1030), volume: 82, Issue: 1, pages: 341-348, Jan. 2015.
 Byoungho Kim and Jacob A. Abraham, Bitstream-Driven Built-in Characterization for Analog and Mixed-Signal Embedded Circuits", IEEE Transactions on Circuits and
 Systems II (TCAS-II, ISSN: 1549-7747), volume: 61, issue: 10, pages: 743-747, Oct. 2014.
 Byoungho Kim and Jacob A. Abraham, Dynamic Performance Characterization of Embedded Single-Ended Mixed-Signal Circuits", IEEE Transactions on Circuits and
 Systems II (TCAS-II, ISSN: 1549-7747), volume: 61, issue: 5, pages: 329-333, May. 2014.
 Byoungho Kim and Jacob A. Abraham, Capacitor-Coupled Built-Off Self-Test in Analog and Mixed-Signal Embedded Systems", IEEE Transactions on Circuits and
 Systems II (TCAS-II, ISSN: 1549-7747), volume: 60, issue: 5, pages: 257-261, May. 2013.
 Byoungho Kim and Jacob A. Abraham, Imbalance-Based Self-Test for High-Speed Mixed-Signal Embedded Systems", IEEE Transactions on Circuits and Systems II
 (TCAS-II, ISSN: 1549-7747), volume: 59, issue: 11, pages: 785-789, Nov. 2012.
 Byoungho Kim and Jacob A. Abraham, Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits", IEEE Transactions on Circuits and Systems I
 (TCAS-I, ISSN: 1549-8328), volume: 58,issue: 8, pages: 1773-1784, Aug. 2011.